July 2006 Symposium on Nanotechnology and the Environment: An Overview on Nanotechnology Detection and Analysis Methods: Biography
Mr. John Scalera
US EPA Office of Environmental Information
John Scalera, a native of Washington DC, graduated magna cum laude from American University in Washington DC with a B.S. in Chemistry in 1977. In 1979 he received a B.S. in Secondary Science Education from the University of Maryland, College Park. Over his 28 years of federal service as a chemist, he has had the opportunity to work in basic research and analytical chemistry in several federal laboratories including the National Institute for Standards and Technology, Walter Reed Army Institute of Research., U.S. Bureau of Mines, and the EPA Region III Laboratory in Annapolis Maryland. His experience as an analytical chemist exposed him to many techniques applicable to the analysis of nanomaterials including transmission electron microscopy, supercritical fluid chromatograph, X-ray diffraction, and differential thermal analysis.
In 1989 Mr. Scalera started his career at EPA Headquarters with the Office of Pollution Prevention and Toxics (OPPT). In 1994, in recognition of his efforts in designing and establishing the EPA National Lead Laboratory Accreditation Program (NLLAP), he received the Agency’s Quality Assurance Manager of the Year award.
Currently he is working in the EPA Office of Environmental Information, Office of Information Analysis and Access (OIAA). In support of OIAA’s Collaboration on Scientific Initiatives Program, he has supported the EPA Science Policy Council’s Committee on Nanotechnology. His efforts for the committee include oversight on the drafting of the Detection and Analysis and Environmental Fate sections of the Science Policy Council’s white paper “Nanotechnology.”